Joe Lyding received his Ph.D. from Northwestern University in 1983. He is a professor in the U of I Department of Electrical and Computer Engineering and a full-time faculty member in the Nanoelectronics and Nanomaterials group. His fields of professional interest are scanning tunneling microscopy, nanofabrication, nanoelectronics, and IC chip reliability.
Honors: DARPA Excellent Performance Citation (1998); Philips Visiting Scholar, Haverford College (1998); University Scholar, UIUC (1997); Fellow of American Physical Society (1997); Associate, UIUC Center for Advanced Study (1996-97); IBM Partnership Award (1996-97); Fellow, UIUC Center for Advanced Study (1987-88); Arnold O. Beckman Award, UIUC (1988, 1985, 1984); Tau Beta Pi Outstanding Teaching Award (1984); ACS Arthur K. Doolittle Award (1983); IBM Postdoctoral Fellowship (1983).